Your Trusted Partner in Semiconductor Testing & Engineering

We work alongside our customers, delivering comprehensive testing and engineering solutions to ensure precision, reliability, and efficiency in every chip

Our Vision & Mission

VNST vision and mission

Vision

Our vision is to be a world leading semiconductor manufacturing partner, providing innovative, high-quality solutions that drive technological advancement and foster global connectivity across industries.

 

Mission

VNST delivers adaptable and reliable semiconductor manufacturing solutions across design, processing, and testing, ensuring exceptional quality and efficiency to empower success in a dynamic market.

Global Semiconductor Testing Partner

Advanced, fast, and cost-effective IC testing solutions serving customers worldwide

America:

2730 Bayview Drive, Fremont, California 94538, USA

Vietnam:

Lot I-3b-1.4, N6 Road, Saigon Hi-Tech Park, Tan Phu Ward, Thu Duc City, Ho Chi Minh City, Vietnam.

Cutting-Edge Technology

Utilizing industry-leading testing methodologies to ensure superior quality and optimal performance for all semiconductor products

High-Density Interconnect (HDI)

Advanced PCB design enhances signal integrity and minimizes attenuation, crucial for high-speed IC testing with fine-pitch and high-frequency applications.

Learn more
Thermal Management Solutions

Thermal Management Solutions

Integrated thermal vias, heat sinks, and active cooling prevent overheating, ensuring reliable test conditions and accurate measurements for temperature-sensitive ICs.

Learn more
Automated Test Conversion

Automated Test Conversion

Proprietary software enables fast, precise conversion of test patterns for leading ATE platforms, optimizing validation workflows and reducing test cycle times.

Learn more
Load Board Conversion & Tester Platform Migration

Load Board Conversion & Tester Platform Migration

Seamless load board adaptation across testers, ensuring precise pin mapping, faster conversion, and full test coverage.

Learn more
Boundary Scan Testing (JTAG)

Boundary Scan Testing (JTAG)

A non-intrusive test method for digital ICs, detecting faults without pin access. Essential for BGAs, ensuring full coverage and efficient debugging.

Learn more

Our History

Get advice solutions for your business from VNST experts!