Comprehensive Turnkey IC Testing Services

Tailored turnkey IC testing solutions covering test program development, multi-platform conversions, multi-package support, device characterization, and reliability testing for all customer needs

Why Choose VNST?

Delivering comprehensive, innovative, and high-quality solutions that drive the sustainable growth of the semiconductor industry.

Accelerated Time-to-Market

Reducing costs and speeding up product deployment for a competitive edge

Cutting-Edge Technology

Utilizing advanced testing methodologies to ensure high efficiency and precision

Flexible Solutions

Tailored to meet diverse needs, from full-scale testing to specific stages

Expert Engineering Team

A highly skilled team with deep expertise in semiconductor technology

Giá cạnh tranh

Giải pháp kiểm thử và thiết kế với chi phí tối ưu, đảm bảo giá trị cao nhất cho khách hàng.

Dịch vụ linh hoạt

Tùy chỉnh giải pháp để đáp ứng chính xác nhu cầu của từng khách hàng.

Công nghệ nổi bật

Kiểm thử tốc độ cao đến 10 Gbps, song song trên 128 pin, và điện áp cao đến 2000V.

Quick Turnaround Time

Thời gian thực hiện nhanh chóng, giúp rút ngắn chu kỳ phát triển sản phẩm.

Key IC Testing Processes

Functional Testing

Every IC must pass functional testing to ensure it operates according to its designed specifications. Testing methods include:

JTAG Boundary Scan – Tests IC pin connectivity without requiring power.
Built-in Self Test (BIST) – Allows the IC to self-diagnose internal faults without external equipment.
Parallel Scan – Speeds up testing by running parallel diagnostics on multiple ICs.

Parametric Testing

Evaluates the electrical and physical characteristics of ICs to ensure performance and reliability:

Signal Integrity – Analyzes signal quality to detect noise and degradation.
Thermal Test – Assesses IC performance under high temperatures to ensure durability.
Leakage Test – Measures leakage current to identify design or manufacturing defects.
Power Integrity – Verifies the stability of power distribution within the IC.
ESD Test (Electrostatic Discharge Test) – Evaluates the IC’s resistance to electrostatic discharge, preventing damage from electrical shocks.

Cutting-Edge Technology

Utilizing industry-leading testing methodologies to ensure superior quality and optimal performance for all semiconductor products

Scan Chains

A structured test method that sequences data through flip-flops, enabling efficient fault detection and validation of internal logic paths.

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Built-in Self-Test (BIST)

An embedded testing mechanism that allows ICs to self-diagnose functional and structural defects, reducing external test dependency and improving efficiency.

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